| Model MATS-2010M |
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Automatic measurement on dynamic hysteresis loop of soft magnetic (silicon steel) material under 50Hz, 60Hz, 400Hz and 1kHz, accurate measurement on dynamic magnetic characteristic parameters such as amplitude permeability μa, loss angle δ, total losses Ps, remanence Br and coercive force Hc.
Windows measurement software applied simply. The product conforms to China National Standards GB / T3655 - 92, GB / T13789 - 92 and international standard IEC60404 - 6.
Analog source (bridge), frequency meter, ammeter, voltmeter and wattmeter are replaced through computer control and A/D sampling, entire testing process automatically completed.
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System Specifications
Under 50Hz frequency, use 25cm epstein trames to measure silicon steel sample, technical indices as follows:
| Parameters measured |
Bm (%) |
Hm(%) |
μa(%) |
Ps(%) |
δ(%) |
| Uncertainty (k=2) |
1 |
1 |
2 |
1 |
2 |
| Repeatability (constant temperature) |
± 0.5 |
± 0.5 |
± 1 |
± 0.5 |
± 1 |
Instrument Specifications
| MATS - 2010M Dynamic Hysteresisgraph |
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PC6111 A/D Card |
Output Power: 500VA sine wave
Frequency Range: 45Hz~ 1000Hz
Frequency Fineness: 1Hz
Frequency Error: < 0.05%
Output Voltage: 0 ~ 10V ~ 50V ~ 150V ~ 300V, four automatic ranges
Voltage Fineness: Program Control 1mV, panel < 0.1% * current range
Voltage Distortion Factor: Superior to 0.5%
Voltage Stability: Superior to 0.02%
Sampling Current: 2mA, 5mA, 10mA, 20mA, 40mA, 80mA, 200mA, 400mA,
800mA, 1.6A, 4A, 8A (Peak Value)
Sample Voltage: 20mV, 40mV, 100mV, 200mV, 400mV, 800mV, 2V, 4V, 8V, 16V,
40V, 80V, 160V, 320V, 800V, 1600V (Peak Value) |
Conversion time: <= 2.5 μ s (every channel)
Resolution and Linearity: 12 Bit ± 1 /2 LSB
Voltage Range: ± 5 V ~ ± 10 V
Sampling Clock: 5 μ s ~ 10ms Hardware Clock
Internal Storage Capacity: 4k Byte
Structure: PCI busbar |
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